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Advances in X-Ray Analysis - Volume 22 - Bog - Paperback

Fra DKK 1221.95
Mærke Springer-Verlag New York Inc.
EAN / Stregkode 9781461399896
Butik Bogreolen.dk
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Advances in X-Ray Analysis - Volume 22

In keeping with recent practice, this year's Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data.

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DKK 1222.95